SEM/EDS Analysis

Scanning electron microscopy is used for high-resolution morphological and chemical characterization of a wide range of surfaces.

Surfaces are scanned with an electron beam producing a detailed surface image (SE detector). With the help of different detectors (BSE and EDS) chemical variability and specific chemical compositions can be determined.

Ask our experts how to analyze your sample to get the most information out of your analysis.



Failure analysis

Why is the glass dull?

Surfaces can be damage due to use. SEM/EDS is an easy and rapid method to determine the cause for surface deterioration.


Micro- and nanoparticle contamination on surfaces

Metal-rich particle contamination on organic surface

With the aid of an electron microscope it is possible to determine the degree of contamination and the cause.


Element mapping

Example shows the distribution of iron and silicon on a geologic sample

It is often crucial to know the distribution of phases in a Material. Elemental maps are the perfect method to determine rapidly and accurately the distribution of elements.


Morphological characterization of surfaces

Surfaces can be extremely complex. SEM analysis is the perfect method to image and characterize complex surfaces.


Technical details of the SEM

ZEISS Gemini 300 (FEG-SEM) equipped
-with SE and EsB in-lens detectors
-4 quadrant, pneumatically retractable BSE detector
-0.8 nm resolution at 15 kV

EDS System
Oxford AZTec Advanced Microanalysis system equipped with
-AZTec Software
-Feature Analysis Software
-X-Max 80 mm2 EDS-Detector  (large window area for EDS analysis in low kV reaching nanometer-scale resolution and detection of low z elements)


Particle Vision Network